Error detection/correction and fault detection/recovery – Pulse or data error handling – Data pulse evaluation/bit decision
Reexamination Certificate
2007-10-09
2007-10-09
Dildine, R. Stephen (Department: 2112)
Error detection/correction and fault detection/recovery
Pulse or data error handling
Data pulse evaluation/bit decision
C375S225000, C375S226000, C375S243000, C375S285000, C375S355000, C375S371000, C714S701000
Reexamination Certificate
active
10977518
ABSTRACT:
In one embodiment, a method may determine a number of data transitions occurring in a forbidden zone at each of a first and second slice levels and adjust a slice level offset for an amplifier based on the number of data transitions at the first and second slice levels. Furthermore, a phase window of the forbidden zone may be adjusted to attain a desired bit error rate for a receiver.
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Dildine R. Stephen
Silicon Laboratories Inc.
Trop Pruner & Hu P.C.
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