Static information storage and retrieval – Read/write circuit – Testing
Reexamination Certificate
2008-07-28
2009-12-15
Le, Vu A (Department: 2824)
Static information storage and retrieval
Read/write circuit
Testing
C365S184000, C365S174000
Reexamination Certificate
active
07633819
ABSTRACT:
A system, method and program product for determining a history state of data in a data retaining device are disclosed. A state of a partially-depleted silicon-on-insulator (PD SOI) device coupled to a data retaining device is measured to indicate a body voltage of the PD SOI device. The body voltage of the PD SOI device may indicate, among others, how long the PD SOI device has been idling, which indirectly indicates how long data in the data retaining device has not been accessed. As such, the current invention may be used efficiently with, e.g., a cache replacement algorithm in a management of the data retaining device.
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Bernstein Kerry
Goodnow Kenneth J.
Ogilvie Clarence R.
Ventrone Sebastian T.
Williams Keith R.
Harding Riyon K.
Hoffman Warnick LLC
International Business Machines - Corporation
Le Vu A
Yang Han
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