Image analysis – Pattern recognition – Feature extraction
Reexamination Certificate
2011-08-16
2011-08-16
Repko, Jason M (Department: 2624)
Image analysis
Pattern recognition
Feature extraction
C382S225000, C382S159000, C382S103000, C702S019000
Reexamination Certificate
active
08000536
ABSTRACT:
The invention concerns a method for determining feature data that represents information about the shape of an object. A partitioning scheme (RP) is determined that defines a plurality of cells (p) in the space in which the object is located such that at least some of the cells (p) each contain a respective portion of the object, and the feature data is determined for the object on the basis of at least one property of the respective portions of the object that are contained in the plurality of cells (p). According to a first aspect of the invention, at least two of the plurality of cells (p) overlap each other at least in part, and according to a second aspect of the invention, at least some of the boundaries of the cells (p) delimit a plurality of regions (r) in the space in which the object is located such that the respective portions of the object that are contained in the plurality of regions (r) are approximately equal to each other with respect to a predetermined measurement metric. The method may be used for performing a similarity search or for performing a similarity classification. A computer program product and an apparatus comprise corresponding features. The invention provides a technology for improving the accuracy and/or effectiveness and/or performance and/or usefulness of prior art methods for determining geometric feature data.
REFERENCES:
patent: 5740270 (1998-04-01), Rutenberg et al.
patent: 6091842 (2000-07-01), Domanik et al.
patent: 6246785 (2001-06-01), Molnar et al.
patent: 6249606 (2001-06-01), Kiraly et al.
patent: 6327377 (2001-12-01), Rutenberg et al.
patent: 6731781 (2004-05-01), Shams et al.
patent: 6768488 (2004-07-01), Kotani et al.
patent: 6928450 (2005-08-01), Mogi et al.
patent: 6956568 (2005-10-01), Maekawa et al.
patent: 7006927 (2006-02-01), Yakhini et al.
patent: 7083405 (2006-08-01), Koyagi et al.
patent: 7430500 (2008-09-01), Lei et al.
patent: 7653495 (2010-01-01), Murali et al.
patent: 7707488 (2010-04-01), Gurcan et al.
patent: 7765070 (2010-07-01), Nicholls
patent: 2002/0001398 (2002-01-01), Shimano et al.
patent: 2003/0036842 (2003-02-01), Hancock
patent: 2003/0185436 (2003-10-01), Smith
patent: 2004/0006431 (2004-01-01), Bartell et al.
patent: 2004/0139103 (2004-07-01), Boyce et al.
patent: 2004/0160590 (2004-08-01), Koyagi et al.
patent: 2005/0075847 (2005-04-01), Yamada et al.
patent: 2005/0152588 (2005-07-01), Yoshida et al.
patent: 2005/0175235 (2005-08-01), Luo et al.
patent: 2005/0283513 (2005-12-01), Usami et al.
patent: 2006/0089803 (2006-04-01), Lei et al.
patent: 2006/0293840 (2006-12-01), Klein
patent: 2007/0058455 (2007-03-01), Usami et al.
patent: 2008/0002873 (2008-01-01), Reeves et al.
patent: 2008/0043039 (2008-02-01), Yamaji et al.
patent: 2008/0184185 (2008-07-01), Saelzer et al.
patent: 2009/0060274 (2009-03-01), Kita
patent: 2010/0054607 (2010-03-01), Aono et al.
Darwish et al. “A Rule Based Approach for Visual Pattern Inspection” IEEE Transactions on Pattern Analysis and Machine Intelligence, vol. 10, No. 1, Jan. 1988, pp. 1-13.
Kriegel et al. “Using Sets of Feature Vectors for Similarity Search on Voxelized CAD Objects”, Jun. 9-12, 2003, pp. 1-12.
Wu et al. “Automated Inspection of Printed Circuit Boards through Machine Vision” Computers in Industry 28 (1996), pp. 103-111.
Abfalg et al “Accurate and Efficient Similarity Search on 3D Objects Using Point Sampling, Redundancy and Proportionality” SSTD (2005) LNCS 3633, pp. 200-217.
Kriegel et al. “Interval Sequences: An Object Relational Approach to Manage Spatial Data” SSTD 2001 LNCS 2121, pp. 481-501.
Hoffman et al. “Parts of Recognition” MIT AI Lab AI Memo No. 732 12—1983 pp. 1-35.
Kriegel et al. “Managing Intervals Efficiently in Object Relational Databases” Proc. of the 26th International Conference on Very Large Databases Cairo, Egypt (2000) pp. 1-12.
Repko Jason M
Siemens Product Lifecycle Management Software Inc.
Thomas Mia M
Wallace Jr. Michael J.
LandOfFree
Determining and using geometric feature data does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Determining and using geometric feature data, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Determining and using geometric feature data will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-2636019