Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
Reexamination Certificate
2011-04-26
2011-04-26
Tabone, Jr., John J (Department: 2117)
Error detection/correction and fault detection/recovery
Pulse or data error handling
Memory testing
C714S006130, C714S025000, C714S047300, C714S719000, C714S723000, C365S200000, C365S201000
Reexamination Certificate
active
07934133
ABSTRACT:
The invention relates to an integrated circuit comprising at least one microprocessor [12]linked to at least one non-volatile memory [14]that can be accessed by sectors. The integrated circuit comprises a detector [20]for discovering when a threshold number of bad sectors has been exceeded in said non-volatile memory [14].
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PCT/ISA/210.
PCT/ISA/237.
Arnoux Christophe
Feyt Nathalie
Buchanan & Ingersoll & Rooney PC
Gemalto SA
Tabone, Jr. John J
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