Detector of abnormal destruction of memory sectors

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing

Reexamination Certificate

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Details

C714S006130, C714S025000, C714S047300, C714S719000, C714S723000, C365S200000, C365S201000

Reexamination Certificate

active

07934133

ABSTRACT:
The invention relates to an integrated circuit comprising at least one microprocessor [12]linked to at least one non-volatile memory [14]that can be accessed by sectors. The integrated circuit comprises a detector [20]for discovering when a threshold number of bad sectors has been exceeded in said non-volatile memory [14].

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patent: 1 418 502 (2004-12-01), None
PCT/ISA/210.
PCT/ISA/237.

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