Thermal measuring and testing – Leak or flaw detection – With heating or cooling of specimen for test
Reexamination Certificate
2008-07-22
2008-07-22
Guadalupe-McCall, Yaritza (Department: 2859)
Thermal measuring and testing
Leak or flaw detection
With heating or cooling of specimen for test
C374S057000
Reexamination Certificate
active
09648140
ABSTRACT:
A mechanism is provided for detecting a defect in a populated sample having a thickness dimension substantially smaller than the length and width dimensions thereof, the populated sample having a first side and an opposite second side, at least said first side of said populated sample having one or more Surface Mounted Components. The mechanism exploits a standard thermographic image which may be used in a detection method comprising1) directing a thermal wave at said second side of said populated sample2) recording a thermographic image of the first side of said populated sample once a surface thereof reaches a predetermined transit temperature or a predetermined transit time period has elapsed; and3) analysing the obtained thermographic image by comparing the so obtained thermographic image with a standard thermographic image.
REFERENCES:
patent: 5032727 (1991-07-01), Cox et al.
patent: 5208528 (1993-05-01), Quintard
patent: 5292195 (1994-03-01), Crisman, Jr.
patent: 5358333 (1994-10-01), Schmidt et al.
patent: 5440566 (1995-08-01), Spence et al.
patent: 5649766 (1997-07-01), Blake
patent: 5657075 (1997-08-01), Roessner
patent: 5775806 (1998-07-01), Allred
patent: 5834661 (1998-11-01), Nonaka et al.
patent: 5984522 (1999-11-01), Koizumi
patent: 6000844 (1999-12-01), Cramer et al.
patent: 6033107 (2000-03-01), Farina et al.
patent: 6146014 (2000-11-01), Bruce et al.
patent: 6271520 (2001-08-01), Tao et al.
patent: 6340817 (2002-01-01), Gelbart
patent: 6343874 (2002-02-01), Legrandjacques et al.
patent: 6375347 (2002-04-01), Bruce et al.
patent: 6686602 (2004-02-01), Some
patent: 6798505 (2004-09-01), Karpol et al.
patent: 6924891 (2005-08-01), Karpol et al.
Pastor Marc
Schlagheck Jerry
ART Advanced Research Technologies Inc.
Fay Sharpe LLP
Guadalupe-McCall Yaritza
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