Detection and repair system and method thereof

Details Detection and repair system and method thereof Detection and repair system and method thereof

2006-08-08

2006-08-08

Patel, Nimeshkumar D. (Department: 2879)

Electric lamp or space discharge component or device manufacturi

Apparatus

Testing or adjusting means

C445S002000, C445S003000, C445S004000, C445S061000, C445S063000

Reexamination Certificate

active

07086919

ABSTRACT:
A detection and repair system includes an optical microscope, an image-retrieving device, an emission detector, a data controller, and a laser beam generator. When detecting the location of a defect, the system charges a detected region of an organic electroluminescent device with a negative bias or low forward bias before the device is lighted on. Then, the emission detector detects the locations of defects, which generate emission such as photons, thermal or IR emission, in an enlarged image. The laser beam generator generates a laser beam, which is used to isolate one of the defects. Furthermore, this invention also discloses a method for detecting and repairing an organic electroluminescent device.

REFERENCES:
patent: 6729922 (2004-05-01), Hiroki
patent: 6888519 (2005-05-01), Yamano et al.
patent: 6909111 (2005-06-01), Yamagata et al.

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