Designing apparatus, and inspection apparatus for designing...

Details Designing apparatus, and inspection apparatus for designing... Designing apparatus, and inspection apparatus for designing...

2005-02-15

2008-05-13

Chiang, Jack (Department: 2825)

Computer-aided design and analysis of circuits and semiconductor

Nanotechnology related integrated circuit design

C716S030000, C716S030000, C716S030000, C716S030000

Reexamination Certificate

active

07373616

ABSTRACT:
A method of designing a semiconductor integrated circuit, comprises: replacing a circuit element disposed in the semiconductor integrated circuit with a transistor having a high threshold value or a circuit element having a small juxtaposition number in order to prevent deviation of a signal voltage flowing through the semiconductor integrated circuit from a power voltage and a ground voltage; replacing a circuit element disposed in a subsequent stage of the replaced circuit element in order to prevent the deviation of the signal voltage from the power voltage and the ground voltage from being propagated to a subsequent stage with a transistor having a high threshold value or a circuit element having a small juxtaposition number; and then arranging circuit elements constituting the semiconductor integrated circuit in such a manner that the semiconductor integrated circuit stably operates.

REFERENCES:
patent: 6380764 (2002-04-01), Katoh et al.
patent: 6493856 (2002-12-01), Usami et al.
patent: 6859917 (2005-02-01), Shimazaki et al.
patent: 7005906 (2006-02-01), Miyamoto et al.
patent: 7216329 (2007-05-01), Kitahara et al.
patent: 2002-9242 (2002-01-01), None
patent: 2002-334930 (2002-11-01), None
patent: 2003-31676 (2003-01-01), None

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