Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2008-05-06
2008-05-06
Garbowski, Leigh M. (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
C716S030000
Reexamination Certificate
active
11111652
ABSTRACT:
A low-leakage circuit design method involves determining a capacity of a power gating transistor using delay statistics, wherein the resulting power gating transistor has sufficient capacity to supply all of the current necessary to meet the demands of the powered design elements while minimizing an amount of chip space required to implement the power gating transistor. The capacity of the power gating transistor is determined by first estimating a capacity necessary to meet the demands of all design elements connected to the transistor. The design elements are then grouped according to input signal arrival time to determine an amount by which the estimated capacity of the gating transistor may be reduced without affecting operation of the design elements. Various grouping schemes are evaluated to determine an optimal grouping. The estimated transistor capacity is reduced according to the optimal grouping, and the power gating transistor is implemented accordingly.
REFERENCES:
patent: 6493856 (2002-12-01), Usami et al.
patent: 7117457 (2006-10-01), Frenkil
Anis et al., “Dynamic and Leakage Power Reduction in MTCMOS Circuits Using an Automated Efficient Gate Clustering Technique,” Design Automation Conference 2002, pp. 480-485.
Anis et al., “Design and Optimization of Multithreshold CMOS (MTCMOS) Circuits”, IEEE Transactions on CAD of ICs and Systems, vol. 22, No. 10. Oct. 2003, pp. 1324-1342.
Babighian et al., “Sizing and Characterization of Leakage-Control Cells for Layout-Aware Distributed Power-Gating”, Proceedings of the Design, Automation and Test in Europe Conference and Exhibition (DATE'04), 2 pages.
Chang et al., “Functionality Directed Clustering for Low Power MTCMOS Design”, ASP-DAC Jan. 2005, pp. 862-867.
Kao et al., “Transistor Sizing Issues and Tool for Multi-Threshold CMOS Technology”, Design Automation Conference 1997, pp. 409-414.
Kao et al., “MTCMOS Hierarchical Sizing Based on Mutual Exclusive Discharge Patterns”, Design Automation Conference 1998, pp. 495-500.
Kao et al., “Dual-Threshold Voltage Techniques for Low-Power Digital Circuits”, IEEE Journal of Solid-State Circuits, vol. 35, No. 7, Jul. 2000, pp. 1009-1018.
Khandelwal et al., “Leakage Control Through Fine-Grained Placement and Sizing of Sleep Transistors”, IEEE Nov. 7-11, 2004, p. 536.
Mukherjee et al., “Clock and Power Gating with Timing Closure”, IEEE Design & Test of Computers, 2003, pp. 32-39.
Ramalingam et al., “Sleep Transistor Sizing Using Timing Criticality and Temporal Currents”, ASP-DAC Jan. 18-21, 2005, pp. 1094-1097.
Brown Scott R.
Garbowski Leigh M.
Xilinx , Inc.
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