Design system of integrated circuit and its design method...

Details Design system of integrated circuit and its design method... Design system of integrated circuit and its design method...

2005-03-22

2005-03-22

Do, Thuan (Department: 2825)

Computer-aided design and analysis of circuits and semiconductor

Nanotechnology related integrated circuit design

C327S270000, C716S030000, C716S030000, C716S030000

Reexamination Certificate

active

06871329

ABSTRACT:
A circuit modification portion modifies circuit information of an integrated circuit depending on a result of a timing test at a timing test portion to presume delay information at a delay presumption portion by modeling the circuit relating to its modified circuit information. Thereafter updating the circuit information and delay information of the integrated circuit at an information update portion to re-test the timing. This allows to carry out a timing analysis/test of the modified circuit without designing layout with the modified circuit information, which is required in a conventional design method. As a result, the number of designing the layout in the integrated circuit design is reduced to shorten time required for the layout design, which allows to shorten time required for the layout design process (layout design, timing analysis/test, and timing adjustment).

REFERENCES:
patent: 5508937 (1996-04-01), Abato et al.
patent: 5751593 (1998-05-01), Pullela et al.
patent: 5896300 (1999-04-01), Raghavan et al.
patent: 6441665 (2002-08-01), Hashidate et al.
patent: 20010010090 (2001-07-01), Boyle et al.
patent: 9-17875 (1997-01-01), None

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