Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2007-10-23
2010-06-15
Chiang, Jack (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
C716S030000, C716S030000, C716S030000, C716S030000, C716S030000, C716S030000, C716S030000, C716S030000, C716S030000, C716S030000, C716S030000, C257S001000, C257S533000, C438S141000, C438S142000, C438S381000
Reexamination Certificate
active
07739636
ABSTRACT:
Design structure embodied in a machine readable medium for designing, manufacturing, or testing a design. The design structure includes active circuitry on a substrate, a bond pad carried by the substrate, and a shielding structure disposed between the substrate and the bond pad. The shielding structure includes a plurality of electrically characterized devices configured to reduce noise transmission from the active circuitry to the bond pad.
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David S. Collins, et al, Semiconductor Device Structures and Methods for Shielding a Bond Pad from Electrical Noise, U.S. Appl. No. 11/778,902, filed Jul. 17, 2007.
Matthew E. Gordon, USPTO, final Office Action issued in related U.S. Appl. No. 11/778,902 dated Oct. 30, 2009.
Matthew E. Gordon, USPTO, Office Action issued in related U.S. Appl. No. 11/778,902 dated Apr. 3, 2009.
Collins David S.
Erturk Mete
Gordon Edward J.
Groves Robert
Rassel Robert M.
Chiang Jack
Doan Nghia M
International Business Machines - Corporation
Wood Herron & Evans LLP
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