Static information storage and retrieval – Systems using particular element – Flip-flop
Reexamination Certificate
2007-10-31
2010-06-15
Hoang, Huan (Department: 2827)
Static information storage and retrieval
Systems using particular element
Flip-flop
C365S189090, C365S230060
Reexamination Certificate
active
07738283
ABSTRACT:
A design structure embodied in a machine-readable medium used in a design process is provided. The design structure comprises a static random access memory (“SRAM”), including a plurality of cells arranged in an SRAM having a plurality of columns; and a voltage control circuit operable to temporarily raise a voltage level of a low voltage reference to cells belonging to a column selected for writing from the plurality of columns, wherein the voltage control circuit includes a first n-type field effect transistor (“NFET”) and a second NFET, the first NFET having a conduction path connected between ground and the low voltage reference, the second NFET having a conduction path connected between a power supply and the low voltage reference.
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Hoang Huan
International Business Machines - Corporation
Schnurmann H. Daniel
LandOfFree
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