Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2006-04-18
2006-04-18
Smith, Mattew S. (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
C716S030000
Reexamination Certificate
active
07032199
ABSTRACT:
A method of design rule checking an integrated circuit identifies any line having a line width marker and line width parameter, extracts each line having a line width marker, determines the line width parameter for each extracted line, and compares the line width parameter with an actual line width for the line.
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Ababei Adriana
Chevallier Christophe
Leffert Jay & Polglaze P.A.
Levin Naum
Micro)n Technology, Inc.
Smith Mattew S.
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