Design implementation to suppress latchup in voltage...

Electricity: electrical systems and devices – Safety and protection of systems and devices – Load shunting by fault responsive means

Reexamination Certificate

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C257S360000

Reexamination Certificate

active

10982347

ABSTRACT:
The voltage tolerant circuit with improved latchup suppression includes: a diode device having a first end coupled to a source voltage node; a first NWELL guard ring surrounding the diode device; a diode coupled between a second end of the string of diodes and an output pad; a second NWELL guard ring surrounding the diode; and a transistor device coupled between the output pad and a substrate node. The NWELL guardrings disrupt the parasitic SCR operation by adding an additional N+ diffusion without affecting the substrate pump current delivered by the diode.

REFERENCES:
patent: 5945713 (1999-08-01), Voldman
patent: 5959820 (1999-09-01), Ker et al.
patent: 6858902 (2005-02-01), Salling et al.
patent: 6965504 (2005-11-01), Liu et al.

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