Static information storage and retrieval – Systems using particular element – Flip-flop
Reexamination Certificate
2005-05-10
2005-05-10
Hoang, Huan (Department: 2818)
Static information storage and retrieval
Systems using particular element
Flip-flop
C365S156000, C365S230060, C365S226000
Reexamination Certificate
active
06891745
ABSTRACT:
A new method to improve the reading margin in a SRAM memory array is achieved. The method comprises providing an array of SRAM cells. Each SRAM cell has a power supply terminal. A first voltage is forced on the power supply terminal of a first SRAM cell that is selected for reading. A second voltage is forced on the power supply terminal of a second SRAM cell that is not selected for reading. The first voltage does not equal the second voltage. A new SRAM device featuring this method is disclosed.
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Hoang Huan
Taiwan Semiconductor Manufacturing Company
Thomas Kayden Horstemeyer & Risley
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