Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2007-07-03
2007-07-03
Do, Thuan (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
C716S030000, C716S030000
Reexamination Certificate
active
10759114
ABSTRACT:
In a system that provides CAD layout-design information, by having the user acquire information such as circuit design or CAD layout data registered in a database, the user can analyze the acquired information, so there is a possibility that circuit-design or circuit-board-design know-how could be leaked. With this invention, a characteristic-parameter-extraction means extracts characteristic parameters from a position where there is a possibility of the occurrence of poor electrical characteristics due to an influence of the CAD layout of the input CAD layout data. A correction-determination means determines whether or not it is necessary to correct the layout by comparing the characteristic parameters and correction-determination standards that correspond to poor electrical characteristics read from a database. This makes it possible to check the electrical characteristics of the CAD layout without making available to the user the correction-determination standards or determination method.
REFERENCES:
patent: 5544067 (1996-08-01), Rostoker et al.
patent: 5559997 (1996-09-01), Tsuchida et al.
patent: 5864875 (1999-01-01), Van Huben et al.
patent: 5949701 (1999-09-01), Saito et al.
patent: 6110213 (2000-08-01), Vinciarelli et al.
patent: 6629305 (2003-09-01), Ito et al.
patent: 6987581 (2006-01-01), Silverbrook et al.
patent: 2003/0097246 (2003-05-01), Hara et al.
patent: P2002-157280 (2002-05-01), None
Kiyohara Tokuzo
Saito Yoshiyuki
Do Thuan
Levin Naum
McDermott Will & Emery LLP
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