Design check system, design check method and design check...

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design

Reexamination Certificate

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C716S030000, C716S030000

Reexamination Certificate

active

10759114

ABSTRACT:
In a system that provides CAD layout-design information, by having the user acquire information such as circuit design or CAD layout data registered in a database, the user can analyze the acquired information, so there is a possibility that circuit-design or circuit-board-design know-how could be leaked. With this invention, a characteristic-parameter-extraction means extracts characteristic parameters from a position where there is a possibility of the occurrence of poor electrical characteristics due to an influence of the CAD layout of the input CAD layout data. A correction-determination means determines whether or not it is necessary to correct the layout by comparing the characteristic parameters and correction-determination standards that correspond to poor electrical characteristics read from a database. This makes it possible to check the electrical characteristics of the CAD layout without making available to the user the correction-determination standards or determination method.

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patent: 6987581 (2006-01-01), Silverbrook et al.
patent: 2003/0097246 (2003-05-01), Hara et al.
patent: P2002-157280 (2002-05-01), None

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