Design and methodology for manufacturing data processing systems

Details Design and methodology for manufacturing data processing systems Design and methodology for manufacturing data processing systems

1998-03-31

2000-05-23

An, Meng-Ai T.

Error detection/correction and fault detection/recovery

Data processing system error or fault handling

Reliability and availability

712 28, 712236, 714 2, 714 8, 714 10, 714 11, 714 13, 714 25, 714 31, 714 40, 714 41, 714710, G06F 1122

Patent

active

060676337

ABSTRACT:
A multi-processor system and methodology optimize overhead costs associated with manufacturing large integrated circuit devices having multiple data processors and processing elements thereon by effectively disabling processing elements that are not functional. Disabling the processing elements is performed through segmented power distribution on an integrated circuit first-level package or by providing inhibit signals in pre-selected logic states based on the functionality of the multi-processing system. The functionality of the multiprocessing system is determined during an initial testing procedure, including wafer-level testing.

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