Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2005-10-04
2005-10-04
Thompson, A. M. (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
C716S030000, C716S030000
Reexamination Certificate
active
06952812
ABSTRACT:
A design analysis tool performs path extraction translation and false path identification functions. The design analysis tool is utilized with a conventional automated test pattern generator and timing analysis tools. By checking for four specific criteria, a fast and efficient way to detect whether a circuit path is false or active is accomplished. A final value condition is checked and, if that test is met, a side value propagation condition is checked. Assuming both tests result in the path still being active, the test is terminated. If the side value propagation conditions are not satisfied, then an initial value condition and a slower path condition is checked. The checks are made to determine whether or not conditions exist in the path that makes the path false. The information may be obtained quickly from the timing analysis information and the result of the ATPG tool.
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Abadir Magdy S.
Bhadra Jayanta
Zeng Jing
Chiu Joanna G.
Freescale Semiconductor Inc.
King Robert L.
Thompson A. M.
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