Delayed interferometer enabling a reduction of...

Details Delayed interferometer enabling a reduction of... Delayed interferometer enabling a reduction of...

2008-03-07

2010-12-07

Lee, Hwa S. A (Department: 2886)

Optics: measuring and testing

By light interference

Having polarization

Reexamination Certificate

active

07847952

ABSTRACT:
An interferometer of the present invention includes: a splitting element which splits an incident light beam into a first split beam and a second split beam; and a first phase compensator which is positioned in an optical path of the first split beam, and which compensates a phase difference occurring between the first split beam and the second split beam upon splitting of the incident light beam by said splitting element.

REFERENCES:
patent: 5491551 (1996-02-01), Mattson
patent: 5684545 (1997-11-01), Dou et al.
patent: 2006/0072927 (2006-04-01), Kim et al.
patent: 2007/0229841 (2007-10-01), Feldman
patent: 1 426 800 (2004-06-01), None
patent: 02/51041 (2002-06-01), None
patent: 2006/092038 (2006-09-01), None
Winzer et al., “Degradations in Balanced DPSK Receivers,” IEEE Photonics Technology Letters, vol. 15, No. 9, Sep. 2003, pp. 1282-1284, XP011100161.

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