Delay locked loop and semiconductor memory device with the same

Static information storage and retrieval – Read/write circuit – Signals

Reexamination Certificate

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Details

C365S193000, C365S233100, C365S233120, C327S156000, C327S158000, C327S296000

Reexamination Certificate

active

08054701

ABSTRACT:
A semiconductor memory device is capable of controlling a delay locked loop appropriately based on operation modes, particularly in a fast power-down mode to reduce an amount of current maximumly. The semiconductor memory device includes a delay-locked clock signal generating unit, a mode signal generating unit, and a delay locking control unit. The delay-locked clock signal generating unit performs a delay locking operation on a clock signal, thereby generating a delay-locked clock signal. The mode signal generating unit enables a fast precharge power-down mode signal in a fast precharge power-down mode. The delay locking control unit controls the delay-locked clock signal generating unit to be activated in a predetermined cycle in response to the fast precharge power-down mode signal.

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Notice of Allowance issued from Korean Intellectual Property Office on Feb. 7, 2011.
Lee et al., “Design of CMOS Analog/Mixed-Mode Integrated System vol. 2”, Sigma Press, 1999, pp. 307-308, 311, 330-331, South Korea.
Examiner's Answer to Appeal Brief as filed with the Patent Court of Korea: Jan. 13, 2010.

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