Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2006-05-23
2006-05-23
Dinh, Paul (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
C716S030000, C716S030000, C324S628000, C324S677000
Reexamination Certificate
active
07051305
ABSTRACT:
A method of estimating delay which includes configuring a first signal path and second signal path such that the first signal path is a victim signal path and the second signal path is an aggressor signal path, calculating Miller factors between the victim signal path and the aggressor signal path for a plurality of edge combinations between a victim signal edge and an aggressor signal edge, and using the Miller factors to perform a timing analysis.
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Chen George J.
Ha Hien T.
Mains Robert E.
Dinh Paul
Hamilton & Terrile LLP
Sun Microsystems Inc.
Terrile Stephen A.
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