Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
Reexamination Certificate
2004-12-22
2009-02-17
Britt, Cynthia (Department: 2117)
Error detection/correction and fault detection/recovery
Pulse or data error handling
Memory testing
C714S724000
Reexamination Certificate
active
07493533
ABSTRACT:
A delay detecting apparatus detects delay amounts of delay elements in a semiconductor device by using a test mode. The semiconductor device comprises a delay signal detecting unit for detecting delays of delay elements in the semiconductor device by using a signal that is synchronized with an external clock, and a delay signal outputting unit for outputting a delayed signal from the delay signal detecting unit to a data pad by using the signal that is synchronized with the external clock.
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Choi Jun-Gi
Hur Hwang
Kim Tae-Yun
Britt Cynthia
Hynix / Semiconductor Inc.
Lowe Hauptman & Ham & Berner, LLP
Merant Guerrier
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