Delay detecting apparatus of delay element in semiconductor...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing

Reexamination Certificate

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C714S724000

Reexamination Certificate

active

07493533

ABSTRACT:
A delay detecting apparatus detects delay amounts of delay elements in a semiconductor device by using a test mode. The semiconductor device comprises a delay signal detecting unit for detecting delays of delay elements in the semiconductor device by using a signal that is synchronized with an external clock, and a delay signal outputting unit for outputting a delayed signal from the delay signal detecting unit to a data pad by using the signal that is synchronized with the external clock.

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