Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2007-08-21
2007-08-21
Lin, Sun James (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
C716S030000, C716S030000
Reexamination Certificate
active
11192526
ABSTRACT:
A method of computing output delay in a mathematical model of an integrated circuit by sorting cells of original design of an the integrated circuit in a topological order. The original output delays for the sorted cells in the original design are computed in the topological order, to produce original output ramp times. The original output ramp times are propagated and original output delays are computed, and the original output ramp time and original output load for each cell is stored. The cells of the original design are modified to produce a modified design. For each modified cell in the topological order, a new output delay and a new output ramp time are computed and compared to the original output ramp time on the modified cell. When the new output ramp time substantially equals the original output ramp time for a modified cell, the calculations of the modified output ramp time for cells that are further down in the topological order are stopped. Otherwise the calculations of the modified output ramp time for cells that are further down in the topological order are continued until a cell is reached where the new output ramp time substantially equals the original output ramp time.
REFERENCES:
patent: 5903468 (1999-05-01), Misheloff et al.
patent: 6532576 (2003-03-01), Mbouombouo et al.
patent: 6546541 (2003-04-01), Petranovic et al.
Bhutani Sandeep
Cui Qian
Guo Weiqing
Lin Sun James
LSI Corporation
Luedeka Neely & Graham
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