Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital data error correction
Reexamination Certificate
2005-10-18
2009-11-03
Abraham, Esaw T (Department: 2112)
Error detection/correction and fault detection/recovery
Pulse or data error handling
Digital data error correction
C714S785000
Reexamination Certificate
active
07613988
ABSTRACT:
Processing Reed Solomon data is disclosed. A scratch polynomial having a degree is obtained using an inversionless Berlekamp-Massey process. The degree of the scratch polynomial is limited. A magnitude of an error associated with the Reed Solomon data is determined based at least in part on information associated with the degree limited scratch polynomial. In some embodiments, determining the magnitude of an error using the degree limited scratch polynomial enables a smaller device.
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Kou Yu
Wu Yingquan
Abraham Esaw T
Link—A—Media Devices Corporation
Van Pelt & Yi & James LLP
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