Defective memory block identification in a memory device

Details Defective memory block identification in a memory device Defective memory block identification in a memory device

2009-09-29

2011-10-25

Gaffin, Jeffrey A (Department: 2117)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Memory testing

C714S704000, C714S710000

Reexamination Certificate

active

08046646

ABSTRACT:
During manufacture and testing of a memory device, a memory test is performed to determine which, if any, memory blocks are defective. A memory map of the defective blocks is stored in one of the defect-free memory blocks so that it can be read later by a controller during normal operation of the memory device. In one embodiment, the memory test is for a programmability test to determine if the memory block can be programmed. An indication of programmability is stored in each block in a predetermined location.

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