Defective data site information storage

Electrical computers and digital processing systems: memory – Storage accessing and control – Memory configuring

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C711S103000, C711S173000, C711S202000, C714S052000

Reexamination Certificate

active

10689143

ABSTRACT:
A method of storing defective data site information for a storage device according to a particular embodiment of the invention includes determining a first defective data site associated with the storage device, determining a second defective data site associated with the storage device, determining a spacing value that represents spacing between the first defective data site and the second defective data site, and storing the spacing value. Apparatus and method aspects according to other embodiments of the invention also are disclosed.

REFERENCES:
patent: 5539697 (1996-07-01), Kim et al.
patent: 5844911 (1998-12-01), Schadegg et al.
patent: 5991699 (1999-11-01), Kulkarni et al.
patent: 6178549 (2001-01-01), Lin et al.
patent: 6192487 (2001-02-01), Douceur
patent: 6212647 (2001-04-01), Sims, III et al.
patent: 6222768 (2001-04-01), Hollmer et al.
patent: 6223303 (2001-04-01), Billings et al.
patent: 6256756 (2001-07-01), Faulk, Jr.
patent: 6266677 (2001-07-01), Rodgers et al.
patent: 6266791 (2001-07-01), Taugher et al.
patent: 6396741 (2002-05-01), Bloom et al.
patent: 6427186 (2002-07-01), Lin et al.
patent: 2004/0184315 (2004-09-01), Hidaka

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Defective data site information storage does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Defective data site information storage, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Defective data site information storage will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3735214

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.