Defect tracking by utilizing real-time counters in network...

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design

Reexamination Certificate

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Details

C716S030000, C324S537000, C714S025000

Reexamination Certificate

active

07065723

ABSTRACT:
Disclosed are novel methods and apparatus for manipulating and generating a real-time counter in network computing environments. In an embodiment, a method of tracking a defect is disclosed. The method includes providing a defect abstract, the defect abstract including information to identify the defect; identifying a component having the defect; assigning a user to resolve the defect; and assigning a defect number to identify the defect, the defect number obtained by incrementing a counter value stored in a file, the file being accessible by a single user at a time.

REFERENCES:
patent: 4855670 (1989-08-01), Green
patent: 5682472 (1997-10-01), Brehm et al.
patent: 5835601 (1998-11-01), Shimbo et al.
patent: 6466978 (2002-10-01), Mukherjee et al.
patent: 6539506 (2003-03-01), Lammers et al.
patent: 6549996 (2003-04-01), Manry et al.

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