Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2006-06-20
2006-06-20
Dinh, Paul (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
C716S030000, C324S537000, C714S025000
Reexamination Certificate
active
07065723
ABSTRACT:
Disclosed are novel methods and apparatus for manipulating and generating a real-time counter in network computing environments. In an embodiment, a method of tracking a defect is disclosed. The method includes providing a defect abstract, the defect abstract including information to identify the defect; identifying a component having the defect; assigning a user to resolve the defect; and assigning a defect number to identify the defect, the defect number obtained by incrementing a counter value stored in a file, the file being accessible by a single user at a time.
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Folta Alan C.
Tom Sze
Tran Trung M.
Dinh Paul
Sun Microsystems Inc.
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