Defect information managing method, information recording...

Details Defect information managing method, information recording... Defect information managing method, information recording...

2006-06-20

2010-06-22

Tabone, Jr., John J (Department: 2117)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Digital data error correction

C714S042000, C369S047140, C369S047220, C369S053170

Reexamination Certificate

active

07743307

ABSTRACT:
In order to select the latest defect management information, the latest selection information first is selected by searching a plurality of selection information areas for a currently active selection information area in which the latest selection information is recorded and subsequently the latest defect management information is obtained by searching a plurality of defect management areas for a currently active defect management area in which the latest defect management information is recorded. If there is no unused defect management area in which defect management information can be alternatively recorded in lieu of the currently active defect management area, recording operation is limited.

REFERENCES:
patent: 6671243 (2003-12-01), Ando et al.
patent: 7027373 (2006-04-01), Ueda et al.
patent: 2004/0057357 (2004-03-01), Takahashi et al.
patent: 2004/0257933 (2004-12-01), Takahashi
patent: 1 381 047 (2004-01-01), None
patent: 1 460 633 (2004-09-01), None
patent: 2004-39076 (2004-02-01), None
patent: 2004-288285 (2004-10-01), None
patent: 2005-56542 (2005-03-01), None
patent: 2006-59527 (2006-03-01), None
patent: 2006-185509 (2006-07-01), None
patent: 2006-236552 (2006-09-01), None
patent: 2007-299526 (2007-11-01), None
patent: 200410242 (2004-06-01), None

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