Defect estimation apparatus and related method

Details Defect estimation apparatus and related method Defect estimation apparatus and related method

2008-07-01

2008-07-01

Trimmings, John P (Department: 2117)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Error count or rate

C714S752000, C714S042000, C714S006130, C714S006130, C714S048000, C714S769000, C714S746000, C714S805000, C714S031000, C714S025000, C714S705000, C369S053170, C369S044320, C369S053150, C369S059220, C369S044250, C702S035000, C711S112000, C711S105000

Reexamination Certificate

active

11306360

ABSTRACT:
A weighted defect estimating apparatus and a related method for determining a defect estimation value are disclosed. The weighted defect detecting apparatus includes: a defect detecting unit for generating a defect value when a defect in a predetermined region of an optical disc is detected; a weighting circuit, electrically connected to the defect detecting unit, to generate a weighted defect value according to the defect value and a weighting factor corresponding to a location of the defect on the optical disc; and a computing module, electrically connected to the weighting circuit, for computing the defect estimation value according to a plurality of weighted defect values corresponding to the predetermined region.

REFERENCES:
patent: 5621743 (1997-04-01), Tomisawa
patent: 6061760 (2000-05-01), Huang
patent: 6986095 (2006-01-01), Maeda et al.
patent: 7032127 (2006-04-01), Egan et al.
patent: 7349296 (2008-03-01), Akkermans et al.
patent: 2001/0026508 (2001-10-01), Sasaki et al.
patent: 2004/0130982 (2004-07-01), Lee et al.

Affiliated with

Also associated with

Rating

Defect estimation apparatus and related method does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Defect estimation apparatus and related method, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Defect estimation apparatus and related method will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-3914991