Defect detection and handling for memory based on pilot cells

Details Defect detection and handling for memory based on pilot cells Defect detection and handling for memory based on pilot cells

2008-03-20

2010-11-02

Chung, Phung M (Department: 2117)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Error count or rate

C714S718000, C714S723000

Reexamination Certificate

active

07827450

ABSTRACT:
A memory system includes a first parameter estimation module that receives pilot signals that are generated based on pilot data stored in a memory. The first parameter estimate module generates a first estimate of a signal quality value associated with a block of the memory based on reference pilot information. A second parameter estimation module generates a second estimate of the signal quality value based on the first estimate and user data signals that are generated based on user data stored in the memory. A processing module generates recovered user data based on the second estimate.

REFERENCES:
patent: 6279133 (2001-08-01), Vafai et al.
patent: 6501812 (2002-12-01), Yada
patent: 2007/0067704 (2007-03-01), Altintas et al.
patent: 2007/0171714 (2007-07-01), Wu et al.
patent: 2007/0171730 (2007-07-01), Ramamoorthy et al.
patent: 2009/0059861 (2009-03-01), Gunnarsson et al.
patent: 2009/0110033 (2009-04-01), Shattil
patent: 2009/0296798 (2009-12-01), Banna et al.
patent: 2 418 820 (2006-04-01), None
patent: WO2007/132453 (2007-11-01), None
The International Search Report and the Written Opinion of the International Searching Authority, or the Declaration mailed Mar. 3, 2009 for International Application No. PCT/US2008/074414 filed Aug. 27, 2008; 13 pages.

Affiliated with

Also associated with

Rating

Defect detection and handling for memory based on pilot cells does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Defect detection and handling for memory based on pilot cells, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Defect detection and handling for memory based on pilot cells will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-4242021