Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode
Reexamination Certificate
2006-03-07
2006-03-07
Fourson, George (Department: 2823)
Active solid-state devices (e.g., transistors, solid-state diode
Field effect device
Having insulated electrode
C257S296000, C257S303000, C257S309000, C257SE29346
Reexamination Certificate
active
07009238
ABSTRACT:
A method for manufacturing a trench capacitor that includes providing a semiconductor substrate, forming a deep trench in the substrate, forming a thin sacrificial layer on a surface of the trench, and forming a hemispherical silicon grain layer over the thin sacrificial layer, wherein the sacrificial layer has a thickness to act as an etch stop during a subsequent step to remove at least a portion of the hemispherical silicon grain layer, and is electrically conductive.
REFERENCES:
patent: 5877061 (1999-03-01), Halle et al.
patent: 6177696 (2001-01-01), Bronner et al.
patent: 6297088 (2001-10-01), King
patent: 6448131 (2002-09-01), Cabral, Jr. et al.
patent: 6509599 (2003-01-01), Wurster et al.
patent: 6555430 (2003-04-01), Chudzik et al.
patent: 6613642 (2003-09-01), Rahn et al.
patent: 6770526 (2004-08-01), Chudzik et al.
patent: 6806138 (2004-10-01), Cheng et al.
patent: 6841443 (2005-01-01), Temmler et al.
patent: 2002/0072171 (2002-06-01), Forster et al.
patent: 2003/0064591 (2003-04-01), Lutzen et al.
patent: 2004/0079979 (2004-04-01), Lee et al.
Chen Shih-Lung
Lee Yueh-Chuan
Finnegan Henderson Farabow Garrett & Dunner L.L.P.
Fourson George
Pham Thanh V.
ProMOS Technologies Inc.
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