Deep filled vias

Semiconductor device manufacturing: process – Chemical etching – Combined with coating step

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C438S704000

Reexamination Certificate

active

07060624

ABSTRACT:
Flared and non-flared metallized deep vias having aspect ratios of about 2 or greater are provided. Blind vias have been fabricated in silicon substrates up to a depth of about 300 microns, and flared through vias have been fabricated up to about 750 microns, the approximate thickness of a silicon substrate wafer, enabling the formation of electrical connections at either or both ends of a via.In spite of the depth and high aspect ratios attainable, the etched vias are completely filled with plated copper conductor, completing the formation of deep vias and allowing fuller use of both sides of the substrate.

REFERENCES:
patent: 3986912 (1976-10-01), Alcorn et al.
patent: 4487652 (1984-12-01), Almgren
patent: 4605470 (1986-08-01), Gwozdz
patent: 4624740 (1986-11-01), Abrrams et al.
patent: 4814041 (1989-03-01), Auda
patent: 4830706 (1989-05-01), Horwath et al.
patent: 4902377 (1990-02-01), Berglund et al.
patent: 5162261 (1992-11-01), Fuller et al.
patent: 5292558 (1994-03-01), Heller et al.
patent: 5308415 (1994-05-01), Chou
patent: 5308929 (1994-05-01), Tani et al.
patent: 5354386 (1994-10-01), Cheung et al.
patent: 5501893 (1996-03-01), Laermer et al.
patent: 5658472 (1997-08-01), Bartha et al.
patent: 5746884 (1998-05-01), Gupta et al.
patent: 5841196 (1998-11-01), Gupta et al.
patent: 6171964 (2001-01-01), Gonzalez et al.
patent: 6249016 (2001-06-01), Chaudhry et al.
patent: 6284666 (2001-09-01), Naeem et al.
patent: 6287963 (2001-09-01), Chen et al.
patent: 6400018 (2002-06-01), Clatanoff et al.
patent: 6400172 (2002-06-01), Akram et al.
patent: 6433301 (2002-08-01), Dunsky et al.
patent: 6506332 (2003-01-01), Pedigo
patent: 6522304 (2003-02-01), Ballantine et al.
S. Aachboun & P. Ranson, Deep anisotropic etching of silicon, J. Vac. Sci. Technol.. A 17(4), Jul./Aug. 1999.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Deep filled vias does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Deep filled vias, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Deep filled vias will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3697981

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.