Decoupling capacitor for high frequency noise immunity

Semiconductor device manufacturing: process – Coating with electrically or thermally conductive material – To form ohmic contact to semiconductive material

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C438S686000, C438S723000, C438S781000, C257SE21008, C257SE21018, C257SE21021, C257SE21088, C257SE21274

Reexamination Certificate

active

07442633

ABSTRACT:
Systems and methods are provided for an on-chip decoupling device and method. One aspect of the present subject matter is a capacitor. One embodiment of the capacitor includes a substrate, a high K dielectric layer doped with nano crystals disposed on the substrate, and a top plate layer disposed on the high K dielectric layer. According to one embodiment, the high K dielectric layer includes Al2O3. According to other embodiments, the nano crystals include gold nano crystals and gold nano crystals. One capacitor embodiment includes a MIS (metal-insulator-silicon) capacitor fabricated on silicon substrate, and another capacitor embodiment includes a MIM (metal-insulator-metal) capacitor fabricated between the interconnect layers above silicon substrate. The structure of the capacitor is useful for reducing a resonance impedance and a resonance frequency for an integrated circuit chip. Other aspects are provided herein.

REFERENCES:
patent: 4333808 (1982-06-01), Bhattacharyya et al.
patent: 4952273 (1990-08-01), Popov
patent: 5366586 (1994-11-01), Samukawa
patent: 5587870 (1996-12-01), Anderson et al.
patent: 5620909 (1997-04-01), Lin et al.
patent: 5656834 (1997-08-01), Grzyb et al.
patent: 5714766 (1998-02-01), Chen et al.
patent: 5906670 (1999-05-01), Dobson et al.
patent: 6159620 (2000-12-01), Heath et al.
patent: 6245617 (2001-06-01), Yang et al.
patent: 6282079 (2001-08-01), Nagakari et al.
patent: 6362012 (2002-03-01), Chi et al.
patent: 6418031 (2002-07-01), Archambeault
patent: 6475854 (2002-11-01), Narwankar et al.
patent: 6511873 (2003-01-01), Ballantine et al.
patent: 6689220 (2004-02-01), Nguyen
patent: 6690052 (2004-02-01), Park et al.
patent: 6700771 (2004-03-01), Bhattacharyya
patent: 6955960 (2005-10-01), Bhattacharyya
patent: 2002/0000593 (2002-01-01), Nishiyama et al.
patent: 2002/0090777 (2002-07-01), Forbes et al.
patent: 2002/0175384 (2002-11-01), Ngai et al.
patent: 2006/0007633 (2006-01-01), Bhattacharyya
Bhattacharyya, A. , “Physical & Electrical Characteristics of LPCVD Silicon Rich Nitride”,ECS Technical Digest, J. Electrochem. Soc., 131(11), 691 RDP, New Orleans,(1984),469C.
Kotz, John C., et al.,Chemistry&Chemical Reactivity, Second Edition, Saunders College Publishing,(1991),p. 50-51.
Lee, J. , et al., “Effect of polysilicon gate on the flatband voltage shift and mobility degradation for ALD-Al/sub 2/O/sub 3/ gate dielectric”,International Electron Devices Meeting 2000, Technical Digest. IEDM, (2000),645-648.
Manchanda, L. , “Si-doped aluminates for high temperature metal-gate CMOS: Zr-Al-Si-O, a novel gate dielectric for low power applications”,IEDM Technical Digest, International Electron Devices Meeting, (Dec. 10-13, 2000),23-26.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Decoupling capacitor for high frequency noise immunity does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Decoupling capacitor for high frequency noise immunity, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Decoupling capacitor for high frequency noise immunity will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-4013686

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.