Static information storage and retrieval – Read/write circuit – Bad bit
Reexamination Certificate
2007-05-01
2007-05-01
Phung, Anh (Department: 2824)
Static information storage and retrieval
Read/write circuit
Bad bit
C365S201000
Reexamination Certificate
active
11218717
ABSTRACT:
A column decoder in a semiconductor memory device in which address setting cannot be performed but only a serial access can be performed. The column decoder is constructed by: a redundant fuse for generating a redundant fuse signal; a column decoding circuit for decoding a column address; a column decoding switching circuit for switching an output destination of a decoding result of the column decoding circuit by the redundant fuse signal; and a column driver for driving an output signal of the column decoding switching circuit and generating it to normal column lines and a redundant column line. The column decoding circuit continuously makes the redundant column line operative after the operation of the normal column lines.
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patent: 6320799 (2001-11-01), Miyazaki et al.
patent: 2001/0015932 (2001-08-01), Akaogi et al.
patent: 06-203590 (1994-07-01), None
Nixon & Peabody LLP
Oki Electric Industry Co. Ltd.
Phung Anh
Studebaker Donald R.
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