Data retention monitor

Details Data retention monitor Data retention monitor

2011-01-04

2011-01-04

Ho, Hoai V (Department: 2827)

Static information storage and retrieval

Systems using particular element

Amorphous

C365S189070, C365S201000, C365S189060, C365S189150, C365S189160, C365S046000, C365S100000, C365S112000, C365S148000

Reexamination Certificate

active

07864565

ABSTRACT:
A data retention monitor for a memory cell including a voltage source and a voltage comparator. The voltage source is adapted to provide a selectable voltage to the memory cell. The selectable voltage includes a read voltage and a test voltage, with the test voltage being greater than the read voltage. The voltage comparator is adapted to compare a voltage of the memory cell with a reference voltage after the provision of the selectable voltage to the memory cell. The memory cell retains data when the memory cell voltage generated at least in part by the test voltage is substantially equal to the reference voltage.

REFERENCES:
patent: 6665216 (2003-12-01), Ho et al.
patent: 6707737 (2004-03-01), Tanizaki
patent: 7042760 (2006-05-01), Hwang et al.
patent: 7336526 (2008-02-01), Osada et al.
patent: 7483305 (2009-01-01), Yamada
patent: 7534713 (2009-05-01), Lung
patent: 2006/0198183 (2006-09-01), Kawahara et al.
patent: 2006/0227591 (2006-10-01), Lowrey et al.
Pirovano et al., Reliability Study of Phase-Change Nonvolatile Memories, IEEE Transactions on Device and Materials Reliability, 2004; 4(3):422-427.

Affiliated with

Also associated with

Rating

Data retention monitor does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Data retention monitor, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Data retention monitor will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-2744471