Error detection/correction and fault detection/recovery – Pulse or data error handling – Replacement of memory spare location – portion – or segment
Patent
1996-11-27
2000-02-01
Beausoliel, Jr., Robert W.
Error detection/correction and fault detection/recovery
Pulse or data error handling
Replacement of memory spare location, portion, or segment
365201, G01R 3128
Patent
active
060215127
ABSTRACT:
One or more redundant sub-arrays (324) are added to a memory (316-322) of a data processing system (300) to allow a manufacturer to compensate for defects introduced during the fabrication phase of a semiconductor device upon which it is implemented. Each of these redundant sub-arrays includes a separate and independent wordline decoder (202), bitline decoder (206), and input/output circuit (208). Furthermore, the memory to which the redundant sub-array is added is typically an on-chip memory which is organized into bit-slice sub-arrays. The bit-slice organization of the memory allows the redundant sub-array to be chained together with the on-chip memory. Data-in/data-out multiplexers are used to steer bit-slices of the data around the defective sub-arrays.
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"Building Fast SRAMs With No Process `Tricks`," Electronics, Aug. 7, 1986, pp. 81-83.
Lattimore George McNeil
Masleid Robert Paul
Muhich John Stephen
Beausoliel, Jr. Robert W.
England Anthony V.S.
International Business Machines - Corporation
Iqbal Nadeem
LandOfFree
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