Data output latch control circuit and process for semiconductor

Details Data output latch control circuit and process for semiconductor Data output latch control circuit and process for semiconductor

1993-11-08

1995-01-17

LaRoche, Eugene R.

Static information storage and retrieval

Read/write circuit

Signals

36518905, 3652335, 36523008, 365210, 327291, 326 93, G11C 700

Patent

active

053831551

ABSTRACT:
Control circuit and control processing for a memory system having a system data bus coupled to at least one data output latch. The control circuit and process generate a read command (RC) to enable the at least one data output latch to latch data from the system data bus in response to a read clock signal (RCLK). The read command (RC) occurs substantially simultaneous with the instant that a valid data state exists on the system data bus and is developed without directly monitoring the system data bus. Upon detecting the read clock signal (RCLK) a latch enable signal is generated. A valid data signal is next generated independent of the system data bus through the use of a dummy circuit having multiple dummy cells, dummy bitlines and a common dummy bus. The valid data signal can be generated either simultaneous with the instant of valid data development on the system data bus or can precede the instant of valid data development by a predetermined small interval of time predefined through the system architecture. The read command (RC) is generated upon occurrence of both the latch enable signal and the valid data signal.

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Ta et al., "A 10-ns Embedded Growable Array," IBM Burlington Technical Disclosure, pp. 1-3, Jan. 1992.

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