CVD method for forming a metallic film on a wafer

Coating processes – Direct application of electrical – magnetic – wave – or... – Plasma

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427253, 4272551, 427584, C23C 1608

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056958315

ABSTRACT:
A CVD method for forming a tungsten (W) film, by using a metallic halide (WF.sub.6) as a source gas, on a barrier metallic film containing titanium (Ti). The method includes providing to the edge portion of a wafer a mixed gas containing Ar gas as an inactive gas and a first gas capable of reacting with the halogen atoms in the metallic halide. The first gas is selected from a group consisting of ethylene, acetylene, butene, propylene, a substitute product thereof, and silane, which have .pi. electrons for activation of reaction with the halogen atoms. When an ethylene gas is used in the mixed gas, the the ethylene gas preferably flows at a flow rate of 2 to 7 percent of the flow rate of the Ar gas flowing at a rate of 1000 to 3000 sccm.

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Prabhu, "Vapor Deposition with Unsaturated Hydrocarbons", IBM Technical Disclosure Bulletin, vol. 13, No. 12, May, 1971.
Tang et al., "Solid State Technology", Mar., 1983, pp .125-128.

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