Customized method and apparatus for streamlined testing a partic

Details Customized method and apparatus for streamlined testing a partic Customized method and apparatus for streamlined testing a partic

1995-08-15

1997-10-14

Ramirez, Ellis B.

Excavating

364579, G01R 3128

Patent

active

056779151

ABSTRACT:
A control circuit is customized for use with a particular circuit under test, and permits testing of the circuit without cycling through multiple data register shift operations required by conventional test architectures.

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Lee Whetsel, "An IEEE 1149.1 Based Logic/Signature Analyzer in a Chip", International Test Conference, Oct. 26-30, 1991.
Sridhar Narayanan, Charles Njinda and Melvin Breuer, "Optimal Sequencing of Scan Registers", IEEE, 1992, International Test Conference 1992, Paper 15.2, pp. 293-302.
Komonytsky; "Synthesis of Techniques Creates Complete System Self-Test" Electronics 1983.

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