Current bypass circuit used in a semiconductor integrated circui

Details Current bypass circuit used in a semiconductor integrated circui Current bypass circuit used in a semiconductor integrated circui

1997-02-19

1999-02-16

Santamauro, Jon

Electronic digital logic circuitry

Reliability

326 33, 327493, H03K 15003

Patent

active

058724613

ABSTRACT:
A current bypass circuit used in a semiconductor integrated circuit supplied with power from power sources having respective different DC voltages in relation to a reference potential, a p type (or n type) substrate of the semiconductor integrated circuit being connected to the reference potential, includes a current switching circuit and a voltage level detecting circuit. The current switching circuit is connected between the reference potential and the DC voltage source for switching between a conductive state and a cutoff state. The voltage level detecting circuit is connected to a control power source that maintains the current switching circuit in a conductive state when the voltage appearing across both terminals of the current switching circuit is equal or lower than a predetermined voltage. The voltage level detecting circuit cuts-off the current switching circuit when the voltage across both terminals of the current switching circuit exceeds a predetermined value. Thereby, needed isolation between the elements in the semiconductor integrated circuit is provided.

REFERENCES:
patent: 4922367 (1990-05-01), Hidaka
patent: 5237211 (1993-08-01), Tanaka et al.
patent: 5300765 (1994-04-01), Mizuta
patent: 5398148 (1995-03-01), Perkins et al.
patent: 5418472 (1995-05-01), Moench

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