Single-crystal – oriented-crystal – and epitaxy growth processes; – Apparatus
Reexamination Certificate
2008-01-15
2008-01-15
Hiteshew, Felisa (Department: 1722)
Single-crystal, oriented-crystal, and epitaxy growth processes;
Apparatus
C117S202000, C117S900000, C438S795000
Reexamination Certificate
active
07318865
ABSTRACT:
A manufacturing method of an electronic device includes positioning a processed substrate with respect to a substrate stage of a crystallization apparatus and supporting it with at least one positioning mark previously provided on the processed substrate being used as a references, applying a modulated light beam to a predetermined area of the processed substrate supported by the substrate stage and crystallizing the area, and forming at least one circuit element in the crystallized area of the processed substrate subjected to positioning with the positioning mark being used as a reference.
REFERENCES:
patent: 2002/0079276 (2002-06-01), Miyake
patent: 6-163349 (1994-06-01), None
patent: 2000-505241 (2000-04-01), None
patent: WO 03/092061 (2003-11-01), None
Masakiyo Matsumura, “Preparation of Ultra-Large Grain Silicon Thin-Films by Excimer-Laser”, Journal of the Suface Science Society of Japan, vol. 21, No. 5, 2000, pp. 278-287.
Akita Noritaka
Takami Yoshio
Advanced LCD Technologies Development Center Co. Ltd.
Hiteshew Felisa
Oblon & Spivak, McClelland, Maier & Neustadt P.C.
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