Semiconductor device manufacturing: process – Formation of semiconductive active region on any substrate – Amorphous semiconductor
Reexamination Certificate
2005-04-04
2008-12-30
Nhu, David (Department: 2818)
Semiconductor device manufacturing: process
Formation of semiconductive active region on any substrate
Amorphous semiconductor
C438S197000, C438S463000, C438S488000, C257SE21170, C257SE21051, C257SE21347, C257SE21475, C257SE21562
Reexamination Certificate
active
07470602
ABSTRACT:
A workpiece object is prepared which has a thin film on the surface and made of amorphous material. A pulse laser beam is applied to the thin film, the pulse laser beam having an elongated beam cross section along one direction on the surface of the thin film. With this pulse laser beam, the thin film is melted and thereafter the thin film is solidified to form crystal grains framing chains along a long axis direction of a beam incidence region in first stripe regions. The first stripe regions extend along the long axis direction in regions of the beam incidence region between its center line and borders of the beam incidence region extending along the long axis direction, and are spaced apart from the borders and the center line by a predetermined distance.
REFERENCES:
patent: 5815494 (1998-09-01), Yamazaki et al.
patent: 5936291 (1999-08-01), Makita et al.
patent: 5981974 (1999-11-01), Makita
patent: 6020224 (2000-02-01), Shimogaichi et al.
patent: 6372039 (2002-04-01), Okumura
patent: 6423127 (2002-07-01), Miyamoto et al.
patent: 6566683 (2003-05-01), Ogawa et al.
patent: 6573161 (2003-06-01), Miyasaka et al.
patent: 6753548 (2004-06-01), Ogawa et al.
patent: 2001/0001745 (2001-05-01), Im et al.
patent: 2001/0041426 (2001-11-01), Im
patent: 2002/0045288 (2002-04-01), Yamazaki et al.
patent: 2002/0132402 (2002-09-01), Tankaka et al.
patent: 2003/0032222 (2003-02-01), Okumura
patent: 1304548 (2001-07-01), None
patent: 0 999 244 (2000-05-01), None
patent: 1 083 590 (2001-03-01), None
patent: 1 087 429 (2001-03-01), None
patent: 09-219380 (1997-08-01), None
patent: 11-274095 (1999-10-01), None
patent: 2000-505241 (2000-04-01), None
patent: 2000-260731 (2000-09-01), None
patent: 2000-286195 (2000-10-01), None
patent: 2000-286211 (2000-10-01), None
patent: 2001-035806 (2001-02-01), None
patent: 2001-044135 (2001-02-01), None
patent: 2001-274088 (2001-10-01), None
patent: 2002-270510 (2002-09-01), None
patent: 2002-280302 (2002-09-01), None
patent: 2003-528461 (2003-09-01), None
patent: 2001-0043343 (2001-05-01), None
patent: WO 00/54313 (2000-09-01), None
patent: WO 00/54314 (2000-09-01), None
patent: WO 01/71786 (2001-09-01), None
Chinese Office Action application No. 200380102421.5 dated Apr. 6, 2007.
Official Communication issued in the corresponding Japanese Patent Application No. 2004-548019, mailed on May 27, 2008. (With English translation).
Ryoichi Ishihara et al.; “A Novel Double-Pulse Excimer-Laser Crystallization Method of Silicon Thin-Films”; Jpn. J. Appl. Phys.; vol. 34; pp. 3976-3981; Part 1; No. 8A; Aug. 1995.
Kudo Toshio
Seike Kouji
Yamazaki Kazunori
Nhu David
Squire Sanders & Dempsey L.L.P.
Sumitomo Heavy Industries, LTD.
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