Crystal growth method and crystalline article obtained by said m

Adhesive bonding and miscellaneous chemical manufacture – Delaminating processes adapted for specified product – Delaminating in preparation for post processing recycling step

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

148562, 156612, 156613, 156614, 156DIG111, 437 11, 437 89, 437100, 437173, C30B 2500

Patent

active

052078639

ABSTRACT:
A crystal growth method for crystallizing an amorphous thin film comprises heat-treating an amorphous thin film having a region (I) with a predetermined film thickness and a region (II) with a larger film thickness than the region (I) and having a sufficiently small area so as to form only a single nucleus from which a single crystal is grown by solid phase growth at a temperature not higher than the melting point of the film.

REFERENCES:
patent: 3585008 (1971-06-01), Schwuttke et al.
patent: 3830668 (1974-08-01), Dearnaley et al.
patent: 3976512 (1976-08-01), DeNora et al.
patent: 4378629 (1983-04-01), Bozler et al.
patent: 4383883 (1983-05-01), Mizutani
patent: 4565584 (1986-01-01), Tamura et al.
patent: 4693759 (1987-09-01), Noguchi et al.
Patent Abstracts of Japan, vol. 10, No. 58 (E-386) [2115] (Mar. 7, 1986) and JP-60211822.
T. Noguchi, et al. "Polysilicon Super Thin Film Transistor Technology," Materials Research Society Symposium Proceedings, vol. 106, Polysilicon and Interfaces, pp. 293-304 (1988).

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Crystal growth method and crystalline article obtained by said m does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Crystal growth method and crystalline article obtained by said m, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Crystal growth method and crystalline article obtained by said m will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-1972824

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.