Semiconductor device manufacturing: process – Coating with electrically or thermally conductive material – To form ohmic contact to semiconductive material
Reexamination Certificate
2006-05-02
2006-05-02
Blum, David S. (Department: 2813)
Semiconductor device manufacturing: process
Coating with electrically or thermally conductive material
To form ohmic contact to semiconductive material
C438S666000, C438S669000, C257S773000
Reexamination Certificate
active
07037820
ABSTRACT:
A cross-fill metal fill pattern technique is provided such that portions of a metal fill pattern are patterned to accomplish a secondary function. For instance, in the exemplary embodiments, ever other trace or line of interdigitated fingers is routed to a ground, while the interceding traces or lines of interdigitated fingers are routed to a power supply. In this way, a capacitor function is formed across the power supply, providing additional decoupling for the power supply. Moreover, a suitably tight cross-fill metal fill pattern (i.e., higher density of metal) provides an electrical shielding function for electromagnetic radiation passing therethrough.
REFERENCES:
patent: 6781238 (2004-08-01), Nonaka
Wolf, Stanley; “Silicon Processing for the VLSI Era,” v.2, 1990, p. 555-556.
Booth Richard
Dazzo, Jr. Donald
Agere Systems Inc.
Blum David S.
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