Semiconductor device manufacturing: process – Forming bipolar transistor by formation or alteration of... – Mesa or stacked emitter
Reexamination Certificate
2007-11-29
2010-06-22
Fulk, Steven J (Department: 2891)
Semiconductor device manufacturing: process
Forming bipolar transistor by formation or alteration of...
Mesa or stacked emitter
C257S586000, C257SE29174
Reexamination Certificate
active
07741186
ABSTRACT:
The mobility of charge carriers in a bipolar (BJT) device is increased by creating compressive strain in the device to increase mobility of electrons in the device, and creating tensile strain in the device to increase mobility of holes in the device. The compressive and tensile strain are created by applying a stress film adjacent an emitter structure of the device and atop a base film of the device. In this manner, the compressive and tensile strain are located in close proximity to an intrinsic portion of the device. A suitable material for the stress film is nitride. The emitter structure may be “T-shaped”, having a lateral portion atop an upright portion, a bottom of the upright portion forms a contact to the base film, and the lateral portion overhangs the base film.
REFERENCES:
patent: 5117271 (1992-05-01), Comfort et al.
patent: 6448124 (2002-09-01), Coolbaugh et al.
patent: 6531369 (2003-03-01), Ozkan et al.
patent: 6639256 (2003-10-01), U'Ren et al.
patent: 6667489 (2003-12-01), Suzumura et al.
patent: 6780725 (2004-08-01), Fujimaki
patent: 7060549 (2006-06-01), Craig et al.
patent: 7102205 (2006-09-01), Chidambarrao et al.
patent: 2004/0104405 (2004-06-01), Huang et al.
patent: 2005/0035470 (2005-02-01), Ko et al.
Ghani et al.; A 90 nm High Volume Manufacturing Logic Technology Featuring Novel 45nm Gate Length Strained Silicon CMOS Transistors; Portland Technology Development, TCAD, QRE, Intel Corp.; Electron Devices Meeting-Tech Digest; Dec. 8-10, 2003, Hillsboro, OR.
Rim et al., Fabrication and Mobility Characterics of Ultra-Thin Strained Si Directly on Insulator (SSDOI) MOSFETs; IBM Semiconductor Research and Development Center (SRDC), IEEE Electron Devices Meeting, Tech. Digest p. 517 (1995) Yorktown Heights, NY.
Rim, et al., Enhanced Hole Mobilities in Surface-channel Strained Si p-MOSFETs; Solid State Electronics Laboratory, Stanford University, IEEE Electron Devices Meeting, Tech Digest. pp. 47-52 (2003) Stanford, CA Now with Research Dvision, Yorktown Heights, NY.
Rucker, et al., SiGe: C BICMOS Technology with 3.6 Gate Delay; IHP Im Technologiepark 25, Frankfurt (Oder)., Germany - IEEE 2003.
Chidambarrao Dureseti
Freeman Gregory G.
Khater Marwan H.
Cohn Howard M.
Fulk Steven J
International Business Machines - Corporation
Schnurmann H. Daniel
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