CPL mask and a method and program product for generating the...

Etching a substrate: processes – Forming or treating mask used for its nonetching function

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C216S002000, C216S011000, C216S041000, C216S047000, C216S058000, C216S072000, C430S004000, C430S005000

Reexamination Certificate

active

07998355

ABSTRACT:
A method of generating a mask for printing a pattern including a plurality of features. The method includes the steps of depositing a layer of transmissive material having a predefined percentage transmission on a substrate; depositing a layer of opaque material on the transmissive material; etching a portion of the substrate, the substrate being etched to a depth based on an etching selectivity between the transmissive layer and the substrate; exposing a portion of the transmissive layer by etching the opaque material; etching the exposed portion of the transmissive layer so as to expose an upper surface of the substrate; where the exposed portions of the substrate and the etched portions of the substrate exhibit a predefined phase shift relative to one another with respect to an illumination signal.

REFERENCES:
patent: 5446521 (1995-08-01), Hainsey et al.
patent: 5465859 (1995-11-01), Chapple-Sokol et al.
patent: 5503951 (1996-04-01), Flanders et al.
patent: 5741613 (1998-04-01), Moon et al.
patent: 5935736 (1999-08-01), Tzu
patent: 5969441 (1999-10-01), Loopstra et al.
patent: 6046792 (2000-04-01), Van der Werf et al.
patent: 6387787 (2002-05-01), Mancini et al.
patent: 7338736 (2008-03-01), Kang et al.
patent: 2001/0009745 (2001-07-01), Kim
patent: 2002/0058188 (2002-05-01), Iwasaki et al.
patent: 2002/0136964 (2002-09-01), Pierrat
patent: 2003/0152844 (2003-08-01), Dulman
patent: 2004/0115539 (2004-06-01), Broeke et al.
patent: 2004/0180548 (2004-09-01), Tzu et al.
patent: 2004/0185348 (2004-09-01), Progler
patent: 2006/0099519 (2006-05-01), Moriarty et al.
patent: 0 679 948 (1995-03-01), None
patent: 1398666 (2004-03-01), None
patent: 1491949 (2004-12-01), None
patent: 2002-156741 (2002-05-01), None
patent: 2004-151717 (2004-05-01), None
patent: 2006-504981 (2006-02-01), None
Wu, Banqiu, “Photomask plasma etching: A review”, Jan. 10, 2006; J. Vac. Sci. Technol. B, vol. 24, No. 1 Jan./Feb. 2006—Microelectronics and Nanometer Strucutres, pp. 1-5.
European Search Report, issued in Corresponding European Patent Application No. 07252695.7-1226, dated on Oct. 29, 2007.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

CPL mask and a method and program product for generating the... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with CPL mask and a method and program product for generating the..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and CPL mask and a method and program product for generating the... will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-2750893

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.