Coverage metric and coverage computation for verification...

Details Coverage metric and coverage computation for verification... Coverage metric and coverage computation for verification...

2007-02-20

2007-02-20

Whitmore, Stacy A (Department: 2825)

Computer-aided design and analysis of circuits and semiconductor

Nanotechnology related integrated circuit design

Reexamination Certificate

active

10916258

ABSTRACT:
A method of electronic circuit design includes performing property verification for partitions of a design of an electronic circuit, selecting an outcome for each partition from a plurality of outcome categories, and computing coverage information for each element of the design based on the outcome.

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patent: 2004/0117746 (2004-06-01), Narain et al.
patent: 2004/0199887 (2004-10-01), Jain et al.
patent: 2004/0225974 (2004-11-01), Johnson

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