Coupled microwave ECR and radio-frequency plasma source for plas

Coating apparatus – Gas or vapor deposition – With treating means

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

156345, 118715, 118723MR, 118723ER, C23C 1650

Patent

active

052923703

ABSTRACT:
In a dual plasma device, the first plasma is a microwave discharge having its own means of plasma initiation and control. The microwave discharge operates at electron cyclotron resonance (ECR), and generates a uniform plasma over a large area of about 1000 cm.sup.2 at low pressures below 0.1 mtorr. The ECR microwave plasma initiates the second plasma, a radio frequency (RF) plasma maintained between parallel plates. The ECR microwave plasma acts as a source of charged particles, supplying copious amounts of a desired charged excited species in uniform manner to the RF plasma. The parallel plate portion of the apparatus includes a magnetic filter with static magnetic field structure that aids the formation of ECR zones in the two plasma regions, and also assists in the RF plasma also operating at electron cyclotron resonance.

REFERENCES:
patent: 4585668 (1986-04-01), Asmussen et al.
patent: 4630566 (1986-12-01), Asmussen et al.
patent: 4691662 (1987-09-01), Roppel et al.
patent: 4727293 (1988-02-01), Asmussen et al.
patent: 4832981 (1989-05-01), Yamazaki
patent: 4906900 (1990-03-01), Asmussen
patent: 4943345 (1990-07-01), Asmussen et al.
patent: 4960071 (1990-10-01), Akahori et al.
patent: 4971832 (1990-11-01), Arai et al.
patent: 5032202 (1991-07-01), Tsai et al.
patent: 5079481 (1992-01-01), Moslehi
patent: 5081398 (1992-01-01), Asmussen et al.
patent: 5110619 (1992-05-01), Ogumi et al.
patent: 5181986 (1993-01-01), Ohiwa
C. M. Melliar-Smith and C. J. Mogab, "Plasma-Assisted Etching Techniques for Pattern Delineation," in Thin Film Processes (J. L. Vossen and W. Kern, Eds.), Academic Press, New York, Chapt. V-2 (1978) pp. 497-556.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Coupled microwave ECR and radio-frequency plasma source for plas does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Coupled microwave ECR and radio-frequency plasma source for plas, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Coupled microwave ECR and radio-frequency plasma source for plas will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-150551

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.