Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2007-03-20
2007-03-20
Dinh, Paul (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
C716S030000, C716S030000
Reexamination Certificate
active
11009260
ABSTRACT:
A method of physical design for a programmable logic device can include associating target locations for movable objects with criticality measures and calculating the criticality measure for each target location. A probability for each target location can be calculated. The probability of the target location can be dependent upon the criticality measure for that target location. The method further can include selecting a target location for one of the movable objects for controlled movement during a simulated annealing process. The target location can be selected according to the probability corresponding to each target location.
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Abid Salim
Slonim Victor Z.
Cuenot Kevin
Dinh Paul
Xilinx , Inc.
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