Cost-independent critically-based target location selection...

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design

Reexamination Certificate

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C716S030000, C716S030000

Reexamination Certificate

active

11009260

ABSTRACT:
A method of physical design for a programmable logic device can include associating target locations for movable objects with criticality measures and calculating the criticality measure for each target location. A probability for each target location can be calculated. The probability of the target location can be dependent upon the criticality measure for that target location. The method further can include selecting a target location for one of the movable objects for controlled movement during a simulated annealing process. The target location can be selected according to the probability corresponding to each target location.

REFERENCES:
patent: 6289496 (2001-09-01), Anderson et al.
patent: 6779169 (2004-08-01), Singh et al.
patent: 6871328 (2005-03-01), Fung et al.
U.S. Appl. No. 10/868,956, filed Jun. 15, 2004, Slonim et al.
Jimmy Lam et al.; “Performance of a New Annealing Schedule”; 25th ACM/IEEE Design Automation Conference; Copyright 1988 IEEE; Paper 22.1; pp. 306-311.
M. D. Huang et al.; “An Efficient General Cooling Schedule for Simulated Annealing”; Copyright 1986 IEEE; pp. 381384.
Juan De Vicente et al.; “FPGA Placement by Thermodynamic Combinatorial Optimization”; Proceedings of the 2002 Design, Automation and Test in Europe Conference and Exhibition (Date '02); Copyright 2002 IEEE; pp. 1-7.
Naveed Sherwani; “Algorithms for VLSI Physical Design Automation”; Third Edition; Published by Kluwer Academic Publishers; Copyright 1999; fourth printing 2002; pp. 226-229.

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