Cost-independent criticality-based move selection for...

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design

Reexamination Certificate

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C716S030000, C716S030000

Reexamination Certificate

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10868956

ABSTRACT:
A method of physical design for a programmable logic device (PLD) can include associating movable objects of the PLD with a criticality measure that is dependent upon timing information for a configuration of the PLD (115). The method further can include calculating the criticality measure for each movable object (125) and calculating a probability for each movable object (130). The probability can depend upon the criticality measure for the movable object. The method also can include selecting one or more of the movable objects for controlled move generation within a simulated annealing process (135). Movable objects are selected for controlled move generation according to the probabilities assigned to the movable objects.

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patent: 6871328 (2005-03-01), Fung et al.
Jimmy Lam et al.; “Performance of a New Annealing Schedule”; 1988 IEEE, 25th ACM/IEEE Design Automation Conference; Paper 22.1; pp. 306-311.
M. D. Huang et al.; “An Efficient General Cooling Schedule for Simulated Annealing”; 1986 IEEE; pp. 381-384.
Juan De Vicente et al.; “FPGA Placement by Thermodynamic Combinatorial Optimization”; 2002 IEEE; Proceedings of the 2002 Design, Automation and Test in Europe Conference and Exhibition; pp. 1-7.
Naveed Sherwani; “Algorithms for VLSI Physical Design Automation”; Third Edition; Published by Kluwer Academic Publishers; Copyright 1999; fourth printing 2002; pp. 226-229/.

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