Photocopying – Projection printing and copying cameras – Illumination systems or details
Reexamination Certificate
2006-02-14
2008-12-30
Mathews, Alan A (Department: 2851)
Photocopying
Projection printing and copying cameras
Illumination systems or details
C355S053000, C355S071000, C430S030000
Reexamination Certificate
active
07471375
ABSTRACT:
A method for configuring the optical transfer of a patterning device pattern onto a substrate with a lithographic apparatus is presented. The method includes adjusting an intensity of a first illumination shape relative to a second illumination shape, the first and the second illumination shapes defining respectively a first illumination area and a second illumination area within a pupil plane of an illumination system of the lithographic apparatus, while maintaining the first and second illumination areas substantially constant, and illuminating the patterning device pattern with the first and second illumination shapes.
REFERENCES:
patent: 5305054 (1994-04-01), Suzuki et al.
patent: 5523193 (1996-06-01), Nelson
patent: 5638211 (1997-06-01), Shiraishi
patent: 5673103 (1997-09-01), Inoue et al.
patent: 5680588 (1997-10-01), Gortych et al.
patent: 6049660 (2000-04-01), Ahn et al.
patent: 6452662 (2002-09-01), Mulkens et al.
patent: 6463403 (2002-10-01), Burdorf et al.
patent: 6466304 (2002-10-01), Smith
patent: 6671035 (2003-12-01), Eurlings et al.
patent: 6737662 (2004-05-01), Mulder et al.
patent: 6839125 (2005-01-01), Hansen
patent: 7016017 (2006-03-01), Hansen
patent: 7030966 (2006-04-01), Hansen
patent: 7180576 (2007-02-01), Hansen
patent: 2002/0035461 (2002-03-01), Chang et al.
patent: 2002/0045106 (2002-04-01), Baselmans et al.
patent: 2002/0062206 (2002-05-01), Liebchen
patent: 2002/0152452 (2002-10-01), Socha
patent: 2002/0167653 (2002-11-01), Mulkens et al.
patent: 2003/0073013 (2003-04-01), Hsu et al.
patent: 2003/0082463 (2003-05-01), Laidig et al.
patent: 2003/0093251 (2003-05-01), Chang
patent: 2004/0156030 (2004-08-01), Hansen
patent: 2004/0158808 (2004-08-01), Hansen
patent: 2004/0184030 (2004-09-01), Liebchen
patent: 0 500 393 (1997-11-01), None
patent: 0 486 316 (2000-04-01), None
patent: 0 496 891 (2000-05-01), None
Steven Hansen, U.S. Appl. No. 11/280,985, filed Nov. 17, 2005.
Bernd Geh, U.S. Appl. No. 60/722,981, filed Oct. 4, 2005.
Burkhardt et al., “Illuminator Design for the Printing of Regular Contact Patterns,”Microelectronic Engineering, vol. 41, No. 42, 1998, pp. 91-96.
Chen et al., “Practical Method for Full-Chip Optical Proximity Correction,”SPIE, vol. 3051, 1997, pp. 790-803.
Chen et al., “Optical Proximity Correction for Intermediate-Pitch Features Using Sub-Resolution Scattering Bars,”Journal of Vacuum Science&Technology B, vol. 15, No. 6, Nov./Dec. 1997, pp. 2426-2433.
Flagello et al., “Lithographic Lens Testing: Analysis of Measured Aerial Images, Interferometric Data and Photoresist Measurements,”SPIE Microlithography Seminar, 1996.
Flagello et al., “Towards a Comprehensive Control of Full-Field Image Quality in Optical Photolithography,”SPIE Microlithography Seminar, Mar. 1997.
Gau et al., “Strategy to Manipulate the Optical Proximity Effect by Post-Exposure Bake Processing,”SPIE, vol. 3334, 1998, pp. 885-891.
Gau et al., “The Customized Illumination Aperture Filter for Low k1 Photolithography Process,”SPIE, vol. 4000, Mar. 2000, pp. 271-282.
Hsia et al., “Customized Off-Axis Illumination Aperture Filtering for Sub-0.18 μm KrF Lithography,”SPIE, vol. 3679, Mar. 1999, pp. 427-434.
Liu et al., “The Application of Alternating Phase-Shifting Masks to 140 nm Gate Patterning: Line Width Control Improvements and Design Optimization,”SPIE, vol. 3236, 1998, pp. 328-337.
Smith et al., “Illumination Pupil Filtering Using Modified Quadrupole Apertures,”SPIE, vol. 3334, 1998, pp. 384-394.
Suzuki et al., “Multilevel Imaging System Realizing k1=0.3 Lithography,”SPIE, vol. 3679, Mar. 1999, pp. 396-407.
Wong et al., “Level-Specific Lithography Optimization for 1-Gb DRAM,”IEEE Transactions on Semiconductor Manufacturing, vol. 13, No. 1, Feb. 2000, pp. 76-87.
Colina Luis Alberto Colina Santamaria
Finders Jozef Maria
Hansen Steven George
ASML Netherlands B.V.
Mathews Alan A
Pillsbury Winthrop Shaw & Pittman LLP
LandOfFree
Correction of optical proximity effects by intensity... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Correction of optical proximity effects by intensity..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Correction of optical proximity effects by intensity... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-4035696